Surface characterisation with microscopy and X-ray

Analyse surfaces, structures and failures with microscopy and X-ray methods for development, troubleshooting and damage investigations.

The lab supports companies that need analysis of surfaces, structures, fractures, particles, impurities and coatings. The need typically arises in product development, quality assurance, supplier verification and root cause investigations, where unresolved material questions can delay decisions and leave failures unexplained. The laboratory performs highly specialised analysis across many different and complex surfaces, e.g. metals, polymers, fibres and coatings, using microscopy and X-ray based methods.

Laboratory specialist using screens and microscopy equipment to examine material surfaces and structures. — The laboratory supports the analysis of surfaces, fracture surfaces, and material structures.

Target group and benefits

Supporting teams with surface analysis, measurements and visualisation for troubleshooting and assessment.

The lab is relevant for companies working with product development, design modification, quality control and failure investigations. It’s also used by teams that must assess supplier deliveries or verify whether a material or surface matches specification. It is used when visual inspection alone is not sufficient and when decisions depend on understanding composition, roughness, coating condition, fracture characteristics or sub-surface features.

What the results are used for

The lab provides analysis work, measurements, images and 3D surface data that can be used to identify foreign objects and impurities, compare materials against expected composition, document roughness parameters, examine fractures and visualise structures in two or three dimensions.

Let’s discuss your surface analysis task

Contact our specialists to discuss surfaces, structures, fractures, coatings or material questions and select relevant analysis methods.

Use cases

Investigate surfaces and material structures to support technical decisions and troubleshooting.

Foreign object identification

Use microscopy and elemental or compositional analysis to identify unknown particles, residues or contaminants on a surface or in a material sample. This supports investigations where production disturbances, unexpected deposits or product issues must be linked to a specific source or material type.

Verification of supplier specifications

Examine whether delivered materials or surfaces match specified requirements such as correct material, surface roughness or coating thickness. The facility provides measurements and analysis that can be used when incoming parts, treated surfaces or coated components must be checked against agreed specifications.

Root cause and damage investigation

Analyse fracture surfaces or material conditions to understand why a component failed. Depending on the case, the work can combine visualisation, microanalysis and structural methods to connect the observed damage with the material state and the relevant failure mechanism under investigation.

Roughness and topography assessment

Measure roughness and 3D surface topography on flat, curved or fragile surfaces without physical contact. This is relevant when roughness parameters or surface structure must be documented, for example in relation to coating behaviour, lubrication, wear-related questions or defined surface specifications.

Facility specifications

Combine microscopy, roughness measurement and X-ray methods to examine surfaces and materials at different scales.

SEM and microanalysis

Includes ZEISS EVO 25 SEM with EDS for elemental composition, WDS for trace element analysis, EBSD for local crystallographic information and Micro-XRF for material characterisation.

SEM with FIB

One SEM includes Focused Ion Beam for in situ cross sectioning and examination on and below the surface. Supports evaluation of coating thickness and subsurface structures.

ESEM for humid samples

Environmental SEM supports analysis of humid or water-containing samples, including biological material without drying.

Optical 3D profilometry and AFM

Supports 3D surface topography and surface-finish characterisation from nm to cm scale on flat and highly curved surfaces.

3D X-ray CT

Includes ZEISS XRadia 410 Versa, Nikon XT H 225 and Xradia nanoXCT-100 for non-destructive 3D imaging across different sample sizes and resolution ranges.

X-ray diffraction

Powder and single crystal diffractometers support phase identification and detailed studies of material structure.

Stereo microscopy

ZEISS Stemi 508 supports visual inspection of surfaces and scratches with magnification from 2× to 250×.

SAXS capability

Laboratory SAXS equipment supports SAXS, MAXS, WAXS, GISAXS and reflectometry on isotropic and oriented samples.

XPS surface chemistry

Supports analysis of the chemical state of surfaces where surface chemistry is relevant to the investigation.

Supplementary chemical analysis access

Also includes access to conventional chemical analyses in connection with advanced material characterisation.

Facility setup

Adapt the analysis setup to the sample, surface condition and investigation type so the selected method fits the material question.

SEM method selection

SEM work can be configured with EDS, WDS, EBSD or Micro-XRF depending on whether the task requires elemental composition, trace element analysis, crystallographic information or imaging.

FIB cross sectioning

Focused Ion Beam can be used when the investigation requires cross sections or examination below the surface.

Environmental SEM conditions

ESEM can be used for humid, water-containing or otherwise sensitive samples that should not be dried before analysis.

Optical measurement on difficult surfaces

Optical 3D measurement can be used on fragile, curved or hard-to-access surfaces, including silicone replicas prepared from components or equipment where direct access or sampling is limited.

Tomography across sample conditions

3D X-ray computed tomography (CT) can be adapted to different sample sizes, resolution requirements, energy levels and sample holders.

XRD sample environments

X-ray diffraction can be arranged for powders, bulk samples or single crystals and can include raster scanning, temperature studies or high-pressure conditions.

Standards

Standards for roughness measurement, parameter calculation and roughness parameter definitions.

ISO 4287: 1997

Optical roughness measurement includes measurement according to ISO 4287: 1997 with calculation of parameters such as Ra, Rq and Rz.

ISO 4297: 1997

Roughness parameter definitions are also described with reference to ISO 4297: 1997 for measured height profiles on a surface.

Locations

Locate the surface characterisation lab

Brøndby

Park Allé 345
2605 Brøndby

Phone: +45 43 25 00 00
E-mail: Info@forcetechnology.com

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Reach out to Erik Stieper Brok for more information.