We have state-of-the-art equipment for surface characterisation and analysis. Our equipment covers both 3D-microscopy, electron microscopy and X-ray analysis. 

With our advanced surface characterisation equipment, we are able to perform highly specialised analysis on many different and complex surfaces.

Scanning Electron Microscopy (SEM) using Energy-Dispersive   
X-Ray Spectroscopy

We have two types of SEM in which surface characterisation can be done with nanometer range resolution.
One of our SEM’s has an internal ion source (Focused Ion Beam – FIB). This allows analysis on and under the surface (in situ cross sectioning) and is very suitable for studying sub-surface structures. Expressed in popular terms it is a “Nano Swiss knife” as it is both possible to build and remove material with nanometer precision.

With the SEM we can also perform the following micro analyses:

  • EDS (Energy Dispersive Spectroscopy)
  • µ-XRF (Micro x-ray fluorescence)
  • WDS (Wavelength Dispersive Spectroscopy)
  • EBSD (Electron BackScattered Diffraction)
We also have an ESEM (Environmental scanning electron microscope) which allows us to characterise humid or water containing test material. Examples of this are analysis of biological material without drying up the material.
With this equipment it is possible to both visualise and analyse in great detail (microanalysis down to 1 µm³). For that reason, we are able to characterise a wide spectrum of materials In relation to evaluating new processes, troubleshooting, damage assessment and many other purposes where microanalysis and visualisation are essential.

Advanced optical 3D profilometry with AFM (Atomic Force Microscopy)

The equipment measures and visualises in 3D surface topographies of almost all solid materials in sizes from nm to cm. It is very convenient in order to support companies in development- and design processes of new materials and in relation to quality assurance of these. 
The equipment also perform highly sophisticated surface-finish characterisation down to nano-level on both plane and highly curved surfaces.

X-ray Diffraction (XRD)

Equipment for determination of the crystal structure of crystalline materials.
We also have access to all the “conventional” chemical analysis, which our chemical department offers. That way we can carry out further analysis in connection with advanced characterisation of various material. 
Surface characterisation
Surface characterisation
Surface characterisation